The authors give an instructive survey of the advancements in Scanning Electron Microscopy (SEM) since there has been a new stage in the development of scanning electron microscopes, as they are equipped with special devices for in situ investigations. Thus a "microlab" now exists inside the electron microscope. Different in situ sample treatments, based on mechanical, thermal and electrical effects, as well as on surface modification by radiation and environmental interaction processes, can be used to quantitatively study ...
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The authors give an instructive survey of the advancements in Scanning Electron Microscopy (SEM) since there has been a new stage in the development of scanning electron microscopes, as they are equipped with special devices for in situ investigations. Thus a "microlab" now exists inside the electron microscope. Different in situ sample treatments, based on mechanical, thermal and electrical effects, as well as on surface modification by radiation and environmental interaction processes, can be used to quantitatively study reactions at solid surfaces under well-defined external conditions. The objects under investigation can be of many kinds: engineering materials; electrical and magnetic materials (as used in microelectronics); products of technical and chemical industries; minerals; forensic objects; textiles; pharmaceutical; biological and archaeological specimens.
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Add this copy of In Situ Scanning Electron Microscopy in Materials to cart. $189.99, good condition, Sold by Masalai Press rated 4.0 out of 5 stars, ships from Oakland, CA, UNITED STATES, published 1995 by Titles Supplied by John Wiley & Sons Australia.
Edition:
1995, Titles Supplied by John Wiley & Sons Australia
Publisher:
Titles Supplied by John Wiley & Sons Australia
Published:
1995
Language:
English
Alibris ID:
12529308670
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Seller's Description:
Good. ex-library, abrasion on spine, stamps on outside edges, bookplate inside front cover, stamp on 1st blank page, stamp on title page, label & stamp inside back cover, text unmarked, good binding. 243 pp., illustrations, bibliography, index. The authors of this book give an instructive survey of the latest advancements in Scanning Electron Microscopy (SEM). During the last two decades there has been a new stage in the development of scanning electron microscopes as they are equipped with special devices for in situ investigations. Thus a "microlab" now exists inside the electron microscope. Different in situ sample treatments, based on mechanical, thermal and electrical effects, as well as on surface modification by radiation and environmental interaction processes, can be used to quantitatively study reactions at solid surfaces under well defined external conditions. The objects under investigation can be of many kinds: engineering materials, electrical and magnetic materials (as used in microelectronics), products of technical and chemical industries, minerals, forensic objects, textiles, pharmaceutical, biological and archaeological specimens.
