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Fundamentals of Electromigration-Aware Integrated Circuit Design

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Fundamentals of Electromigration-Aware Integrated Circuit Design - Lienig, Jens, and Thiele, Matthias
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The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce ...

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Fundamentals of Electromigration-Aware Integrated Circuit Design 2018, Springer, Cham

ISBN-13: 9783319735573

2018 edition

Hardcover

Fundamentals of Electromigration-Aware Integrated Circuit Design 2018, Springer, Cham

ISBN-13: 9783030088118

Trade paperback