An Advanced Study Institute on Fast Electrical and Optical Diagnostic Principles and Techniques was held at II Ciocco, Castelvecchio Pascoli, Italy, 10-24 July 1983. This publication is the Proceedings from that Institute. The Institute was attended by ninety-seven participants representing the United States, West Germany, the United Kingdom, Switzerland, Norway, the Netherlands, Italy, and France. The objective of the Institute was to provide a broad but comprehensive presentation of the various measurement and analy- sis ...
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An Advanced Study Institute on Fast Electrical and Optical Diagnostic Principles and Techniques was held at II Ciocco, Castelvecchio Pascoli, Italy, 10-24 July 1983. This publication is the Proceedings from that Institute. The Institute was attended by ninety-seven participants representing the United States, West Germany, the United Kingdom, Switzerland, Norway, the Netherlands, Italy, and France. The objective of the Institute was to provide a broad but comprehensive presentation of the various measurement and analy- sis techniques that can be employed to investigate fast physical events, nominally in the sub-microsecond regime. This requires both an understanding of the basic principles underlying the diagnostic employed and its limitations, and a knowledge of the practical techniques available to obtain reliable and repeatable data. This Institute was thus structured to begin tutorially, followed by more practical techniques, demonstrations, and discussions. The Institute was divided into the following major sections: (1) Overview of Applications and Needs; (2) Voltage and Current Measurements; (3) Data Acquisition; (4) Grounding and Shield- ing; (5) Fast Photography; (6) Refractive Index Measurements; (7) X-ray Diagnostics; (8) Spectroscopy; and (9) Active Opti- cal Techniques. This Proceeding has been divided into two separate volumes. Volume 1, Current and Voltage Measurements, includes Sections (1) through (4) above; Volume 2, Optical Meas- urements, includes Sections (5) through (9).
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Add this copy of Fast Electrical and Optical Measurements, Vol. 2: to cart. $103.90, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Newport Coast, CA, UNITED STATES, published 1986 by Martinus Nijhoff Publishers.
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Fine. Sewn binding. Cloth over boards. 620 p. Contains: Unspecified. NATO Science Series E:, 108. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
Add this copy of Fast Electrical and Optical Measurements: Volume 1 - to cart. $357.38, new condition, Sold by GreatBookPrices rated 4.0 out of 5 stars, ships from Columbia, MD, UNITED STATES, published 1986 by Springer.
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New. Sewn binding. Cloth over boards. 620 p. Contains: Unspecified. NATO Science Series E:, 108. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.