Thoroughly surveys the physics of failure mechanisms in semiconductor devices, from the semiconductor dye itself to the packaging and interconnections. Its specific intention is to identify the processes leading to damage and the techniques used to repair or detect it. Discusses and critiques accelerated lifetesting and how the various tests apply to different failure mechanisms. Also provides a critical review of reliability modelling and estimation and techniques, and quality assurance and screening techniques, ...
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Thoroughly surveys the physics of failure mechanisms in semiconductor devices, from the semiconductor dye itself to the packaging and interconnections. Its specific intention is to identify the processes leading to damage and the techniques used to repair or detect it. Discusses and critiques accelerated lifetesting and how the various tests apply to different failure mechanisms. Also provides a critical review of reliability modelling and estimation and techniques, and quality assurance and screening techniques, emphasizing the complexity of present-generation integrated circuits. Throughout, suggestions are offered on ways to improve the quality of devices.
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Add this copy of Failure Mechanisms in Semiconductor Devices to cart. $227.42, like new condition, Sold by GreatBookPrices rated 4.0 out of 5 stars, ships from Columbia, MD, UNITED STATES, published 1997 by Wiley.
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Seller's Description:
Fine. Sewn binding. Cloth over boards. 360 p. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
Add this copy of Failure Mechanisms in Semiconductor Devices to cart. $229.72, new condition, Sold by GreatBookPrices rated 4.0 out of 5 stars, ships from Columbia, MD, UNITED STATES, published 1997 by Wiley.
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
New. Sewn binding. Cloth over boards. 360 p. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
Add this copy of Failure Mechanisms in Semiconductor Devices to cart. $229.73, new condition, Sold by Ria Christie Books rated 5.0 out of 5 stars, ships from Uxbridge, MIDDLESEX, UNITED KINGDOM, published 1997 by Wiley.
345 pages. A fairly detailed summary of Semiconductor failure modes and reliability calculations. If you are working in this fiels then this book is worth the shelf space and reading.
