Estimating Device Reliability: Assessment of Credibility is concerned with the plausibility of reliability estimates obtained from statistical models. Statistical predictions are necessary because technology is always pushing into unexplored areas faster than devices can be made long-lived by design. Flawed reliability methodologies can produce disastrous results, an outstanding example of which is the catastrophic failure of the manned space shuttle CHALLENGER in January 1986. This issue is not whether, but which, ...
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Estimating Device Reliability: Assessment of Credibility is concerned with the plausibility of reliability estimates obtained from statistical models. Statistical predictions are necessary because technology is always pushing into unexplored areas faster than devices can be made long-lived by design. Flawed reliability methodologies can produce disastrous results, an outstanding example of which is the catastrophic failure of the manned space shuttle CHALLENGER in January 1986. This issue is not whether, but which, statistical models should be used. The issue is not making reliability estimates, but is instead their credibility. The credibility questions explored in the context of practical applications include: What does the confidence level associated with the use of statistical model mean? Is the numerical result associated with a high confidence level beyond dispute? When is it appropriate to use the exponential (constant hazard rate) model? Does this model always provide the most conservative reliability estimate? Are the results of traditional `random' failure hazard rate calculations tenable? Are there persuasive alternatives? What model should be used to describe the useful life of a device when wearout is absent? When Weibull and lognormal failure plots containing a large number of failure times appear similar, how should the correct wearout model be selected? Is it important to distinguish between a conservative upper bound on a probability of failure and a realistic estimate of the same probability? Estimating Device Reliability: Assessment of Credibility is for those who are obliged to make reliability calculations with a paucity of somewhat corrupt data, by using inexact models, and by making physical assumptions which are impractical to verify. Illustrative examples deal with a variety of electronic devices, ICsand lasers.
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Add this copy of Estimating Device Reliability: Assessment of to cart. $90.00, very good condition, Sold by The Chatham Bookseller rated 2.0 out of 5 stars, ships from Madison, NJ, UNITED STATES, published 1993 by Kluwer Academic.
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Near Fine. No Jacket. "6x9 1/4" 212 pp. almost completely like new, only sign of use is previous owners name in top right of inner cover page. is concerned with the plausibility of reliability estimates obtained from statistical models. Statistical predictions are necessary because technology is always pushing into unexplored areas faster than devices can be made long-lived by design. Flawed reliability methodologies can produce disastrous results, an outstanding example of which is the catastrophic failure of the manned space shuttle CHALLENGER in January 1986. This issue is not whether, but which, statistical models should be used. The issue is not making reliability estimates, but is instead their credibility.
Add this copy of Estimating Device Reliability:: Assessment of to cart. $159.68, new condition, Sold by GreatBookPrices rated 4.0 out of 5 stars, ships from Columbia, MD, UNITED STATES, published 1992 by Springer.
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New. Sewn binding. Cloth over boards. 214 p. Contains: Unspecified. The Springer International Engineering and Computer Science, 206. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
Add this copy of Estimating Device Reliability:: Assessment of to cart. $159.69, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 1992 by Springer.
Add this copy of Estimating Device Reliability:: Assessment of to cart. $196.38, like new condition, Sold by GreatBookPrices rated 4.0 out of 5 stars, ships from Columbia, MD, UNITED STATES, published 1992 by Springer.
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Fine. Sewn binding. Cloth over boards. 214 p. Contains: Unspecified. The Springer International Engineering and Computer Science, 206. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
Add this copy of Estimating Device Reliability: Assessment of to cart. $196.39, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Newport Coast, CA, UNITED STATES, published 1992 by Springer.
Add this copy of Estimating Device Reliability:: Assessment of to cart. $212.26, new condition, Sold by Ria Christie Books rated 5.0 out of 5 stars, ships from Uxbridge, MIDDLESEX, UNITED KINGDOM, published 1992 by Springer.
