Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector ...
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Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.
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Add this copy of Digital Circuit Testing: a Guide to Dft and Other to cart. $41.84, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Newport Coast, CA, UNITED STATES, published 1991 by Academic Press.
Add this copy of Digital Circuit Testing: a Guide to Dft and Other to cart. $42.56, good condition, Sold by Anybook rated 5.0 out of 5 stars, ships from Lincoln, UNITED KINGDOM, published 1991 by Academic Press.
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Seller's Description:
This is an ex-library book and may have the usual library/used-book markings inside. This book has hardback covers. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item, 650grams, ISBN: 0127345809.
Add this copy of Digital Circuit Testing: a Guide to Dft, Atvg, and to cart. $69.95, like new condition, Sold by Wm Burgett Bks & Collectibles rated 3.0 out of 5 stars, ships from San Diego, CA, UNITED STATES, published 1991 by Academic Press.
Add this copy of Digital Circuit Testing: A Guide to DFT and Other to cart. $83.22, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 1991 by Academic Press.
Add this copy of Digital Circuit Testing to cart. $84.70, new condition, Sold by Ria Christie Books rated 5.0 out of 5 stars, ships from Uxbridge, MIDDLESEX, UNITED KINGDOM, published 1991 by Academic Press.
