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Digital Circuit Testing: A Guide to DFT and Other Techniques

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Digital Circuit Testing: A Guide to DFT and Other Techniques - Wong, Francis C
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Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector ...

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Digital Circuit Testing: A Guide to DFT and Other Techniques 1991, Academic Press, San Diego, CA

ISBN-13: 9780127345802

Hardcover