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Cross-Talk Noise Immune VLSI Design Using Regular Layout Fabrics - Brayton, Robert K, and Sangiovanni-Vincentelli, Alberto L
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This book was motivated by the problems being faced with shrinking IC process feature sizes. It is well known that as process feature sizes shrink, a host of electrical problems like cross-talk, electromigration, self-heat, etc. are becoming important. Cross-talk is one of the major problems since it results in unpredictable design behavior. In particular, it can result in significant delay variation or signal integrity problems in a wire, depending on the state of its neighboring wires. Typical approaches to tackle the ...

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Cross-Talk Noise Immune VLSI Design Using Regular Layout Fabrics 2012, Springer, New York, NY

ISBN-13: 9781461355731

Trade paperback

Cross-Talk Noise Immune VLSI Design Using Regular Layout Fabrics 2001, Springer, New York, NY

ISBN-13: 9780792374077

2001 edition

Hardcover