Tis book provides an overview of X-ray technology, the historic developmental milestones of modern CT systems, and gives a comprehensive insight into the main reconstruction methods used in computed tomography. Te basis of reconstr- tion is, undoubtedly, mathematics. However, the beauty of computed tomography cannot be understood without a detailed knowledge of X-ray generation, photon- matter interaction, X-ray detection, photon statistics, as well as fundamental signal processing concepts and dedicated measurement systems ...
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Tis book provides an overview of X-ray technology, the historic developmental milestones of modern CT systems, and gives a comprehensive insight into the main reconstruction methods used in computed tomography. Te basis of reconstr- tion is, undoubtedly, mathematics. However, the beauty of computed tomography cannot be understood without a detailed knowledge of X-ray generation, photon- matter interaction, X-ray detection, photon statistics, as well as fundamental signal processing concepts and dedicated measurement systems. Terefore, the reader will ?nd a number of references to these basic disciplines together with a brief introd- tion to the underlying principles of CT. Tis book is structured to cover the basics of CT: from photon statistics to m- ern cone-beam systems. However, the main focus of the book is concerned with - tailed derivations of reconstruction algorithms in ?D and modern ?D cone-beam systems. A thorough analysis of CT artifacts and a discussion of practical issues, such as dose considerations, provide further insight into modern CT systems. While mainly written for graduate students in biomedical engineering, medical engine- ing science, medical physics, medicine (radiology), mathematics, electrical eng- eering, and physics, experienced practitioners in these ?elds will bene?t from this book as well.
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Add this copy of Computed Tomography: From Photon Statistics to Modern to cart. $93.93, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2010 by Springer-Verlag Berlin and Heidelberg GmbH & Co. K.
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2010, Springer-Verlag Berlin and Heidelberg GmbH & Co. K
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Springer-Verlag Berlin and Heidelberg GmbH & Co. K
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2010
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10540294416
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New. 522 p. 10 Tables, color; 296 Illustrations, color; 179 Illustrations, black and white; XIV, 522 p. 475 illus., 296 illus. in color. Intended for professional and scholarly audience.
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Springer-Verlag Berlin and Heidelberg GmbH & Co. K
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2010
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English
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