CMOS SRAM Circuit Design and Parametric Test in Nano-scaled Technologies: Process-aware SRAM Design and Test

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies. Read More

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. The emphasis of the book is on challenges and solutions of stability testing as well as on development of understanding of the link between the process technology and SRAM circuit design in modern nano-scaled technologies. Read Less

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  	This is a digital edition of this title. Rent eBook (5 Options) 30 Day Rental: $47.70 (Expires Jul 20, 2024) 60 Day Rental: $63.60 (Expires Aug 19, 2024) 90 Day Rental: $79.50 (Expires Sep 18, 2024) 120 Day Rental: $95.40 (Expires Oct 18, 2024) 180 Day Rental: $103.35 (Expires Dec 17, 2024) Buy eBook Lifetime Access: $159.00 Title: Cmos Sram Circuit Design and Parametric Test in Nano-Scaled Technologies by Andrei Pavlov; Manoj Sachdev Publisher: Springer Nature Print ISBN: 9781402083624, 1402083629 eText ISBN: 9781402083631 Edition: 2008 2008 edition Format: PDF eBook	$47.70 Rent eBook This is a digital eBook Nothing will be shipped to you Works with web browsers and the VitalSource app on all Windows, Mac, Chromebook, Kindle Fire, iOS, and Android devices Most eBooks are returnable within 14 days of purchase Questions? See our eBook FAQ