It is important to test programmable routing resources in Field Programmable Gate Arrays (FPGAs) because they take up the largest portion of configuration memory bits. In Virtex-4 FPGAs, routing resources account for over 80% of the configuration memory. Built-In Self-Test (BIST) is adopted to test the routing resources in FPGAs and overcomes issues residing in previously developed test approaches. Analysis and evaluations of developed BIST algorithm and configurations are provided.
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It is important to test programmable routing resources in Field Programmable Gate Arrays (FPGAs) because they take up the largest portion of configuration memory bits. In Virtex-4 FPGAs, routing resources account for over 80% of the configuration memory. Built-In Self-Test (BIST) is adopted to test the routing resources in FPGAs and overcomes issues residing in previously developed test approaches. Analysis and evaluations of developed BIST algorithm and configurations are provided.
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Add this copy of Built-in Self-Test of Global Routing Resources in Fpgas to cart. $101.67, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Newport Coast, CA, UNITED STATES, published 2011 by LAP LAMBERT Academic Publishin.
