This book introduces design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).
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This book introduces design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).
Read Less
Add this copy of Built-In-Self-Test and Digital Self-Calibration for RF to cart. $51.65, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2011 by Springer.
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Seller's Description:
New. Print on demand Trade paperback (US). Glued binding. 89 p. Contains: Illustrations, black & white, Tables, black & white. Springerbriefs in Electrical and Computer Engineering.
