Atomic Scale Characterization and First-Principles Studies of Si n Interfaces

This book offers results that influence many high temperature and pressure applications. It provides findings that will offer increased control over the performance of ceramic and semiconductor materials for a wide-range of applications. Read More

This book offers results that influence many high temperature and pressure applications. It provides findings that will offer increased control over the performance of ceramic and semiconductor materials for a wide-range of applications. Read Less

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  	This is a digital edition of this title. Rent eBook (5 Options) 30 Day Rental: $29.70 (Expires Jul 17, 2024) 60 Day Rental: $39.60 (Expires Aug 16, 2024) 90 Day Rental: $49.50 (Expires Sep 15, 2024) 120 Day Rental: $59.40 (Expires Oct 15, 2024) 180 Day Rental: $64.35 (Expires Dec 14, 2024) Buy eBook Lifetime Access: $99.00 Title: Atomic Scale Characterization and First-Principles Studies of Siâ‚Nâ‚„ Interfaces by Weronika Walkosz Publisher: Springer Nature Print ISBN: 9781461428572, 1461428572 eText ISBN: 9781441978172 Edition: 2013 2011 edition Format: EPUB eBook	$29.70 Rent eBook This is a digital eBook Nothing will be shipped to you Works with web browsers and the VitalSource app on all Windows, Mac, Chromebook, Kindle Fire, iOS, and Android devices Most eBooks are returnable within 14 days of purchase Questions? See our eBook FAQ