Skip to main content alibris logo
Atomic Force Microscopy - Eaton, Peter, and West, Paul
Filter Results
Shipping
Item Condition
Seller Rating
Other Options
Change Currency

Atomic force microscopy (AFM) is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and to use. It is written by authors ...

loading
Atomic Force Microscopy 2018, Oxford University Press, Oxford

ISBN-13: 9780198826286

Paperback

Atomic Force Microscopy 2010, Oxford University Press, USA, Oxford, England

ISBN-13: 9780199570454

Hardcover