Scanning Probe Lithography for Chemical, Biological and Engineering Applications.- Nanotribological Characterization of Human Hair and Skin Using Atomic Force Microscopy (AFM).- Nanofabrication with Self-Assembled Monolayers by Scanning Probe Lithography.- Fabrication of Nanometer-Scale Structures by Local Oxidation Nanolithography.- Template Effects of Molecular Assemblies Studied by Scanning Tunneling Microscopy (STM).- Microfabricated Cantilever Array Sensors for (Bio-)Chemical Detection.- Nano-Thermomechanics: ...
Read More
Scanning Probe Lithography for Chemical, Biological and Engineering Applications.- Nanotribological Characterization of Human Hair and Skin Using Atomic Force Microscopy (AFM).- Nanofabrication with Self-Assembled Monolayers by Scanning Probe Lithography.- Fabrication of Nanometer-Scale Structures by Local Oxidation Nanolithography.- Template Effects of Molecular Assemblies Studied by Scanning Tunneling Microscopy (STM).- Microfabricated Cantilever Array Sensors for (Bio-)Chemical Detection.- Nano-Thermomechanics: Fundamentals and Application in Data Storage Devices.- Applications of Heated Atomic Force Microscope Cantilevers.
Read Less
Add this copy of Applied Scanning Probe Methods IV: Industrial to cart. $158.08, like new condition, Sold by GreatBookPrices rated 4.0 out of 5 stars, ships from Columbia, MD, UNITED STATES, published 2010 by Springer.
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
Fine. Trade paperback (US). Glued binding. 284 p. Contains: Tables, black & white. Nanoscience and Technology. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
Add this copy of Applied Scanning Probe Methods IV: Industrial to cart. $159.68, new condition, Sold by GreatBookPrices rated 4.0 out of 5 stars, ships from Columbia, MD, UNITED STATES, published 2010 by Springer.
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
New. Trade paperback (US). Glued binding. 284 p. Contains: Tables, black & white. Nanoscience and Technology. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
Add this copy of Applied Scanning Probe Methods IV: Industrial to cart. $159.69, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2010 by Springer.
Add this copy of Applied Scanning Probe Methods IV: Industrial to cart. $176.21, new condition, Sold by booksXpress, ships from Bayonne, NJ, UNITED STATES, published 2010 by Springer.