Analog IC Reliability in Nanometer CMOS

This book covers modeling, simulation and analysis of analog circuit aging, nanometer CMOS physical effects resulting in unreliability, transistor aging compact models for circuit simulation, methods for efficient circuit reliability simulation and more. Read More

This book covers modeling, simulation and analysis of analog circuit aging, nanometer CMOS physical effects resulting in unreliability, transistor aging compact models for circuit simulation, methods for efficient circuit reliability simulation and more. Read Less

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  	This is a digital edition of this title. Rent eBook (5 Options) 30 Day Rental: $29.70 (Expires Jan 01, 2025) 60 Day Rental: $39.60 (Expires Jan 31, 2025) 90 Day Rental: $49.50 (Expires Mar 02, 2025) 120 Day Rental: $59.40 (Expires Apr 01, 2025) 180 Day Rental: $64.35 (Expires May 31, 2025) Buy eBook Lifetime Access: $99.00 Title: Analog Ic Reliability in Nanometer Cmos by Elie Maricau; Georges Gielen Publisher: Springer Nature Print ISBN: 9781461461623, 1461461626 eText ISBN: 9781461461630 Edition: 2013 2013 edition Format: EPUB eBook	$29.70 Rent eBook This is a digital eBook Nothing will be shipped to you Works with web browsers and the VitalSource app on all Windows, Mac, Chromebook, Kindle Fire, iOS, and Android devices Most eBooks are returnable within 14 days of purchase Questions? See our eBook FAQ