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Advd Model Parameter Extractio

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All model parameters are fundamentally coupled together, so that directly measured individual parameters, although widely used and accepted, may initially only serve as good estimates. This comprehensive resource presents all aspects concerning the modeling of semiconductor field-effect device parameters based on gallium-arsenide (GaAs) and generative adversarial network (GaN) technology. Metal-semiconductor field-effect transistors (MESFETs), high electron mobility transistors (HEMTs) and heterojunction bipolar transistors ...

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Advd Model Parameter Extractio 2019, Artech House Publishers

ISBN-13: 9781630817442

Hardcover