The 39th Annual Denver X-Ray Conference on Applications of X-Ray Analysis was held July 30 -August 3, 1990, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. The "Denver Conference" is recognized to be a major event in the x-ray analysis field, bringing together scientists and engineers from around the world to discuss the state of the art in x-ray applications as well as indications for future develop- ments. In recent years there has been a steady expansion of applications of x-ray ...
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The 39th Annual Denver X-Ray Conference on Applications of X-Ray Analysis was held July 30 -August 3, 1990, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. The "Denver Conference" is recognized to be a major event in the x-ray analysis field, bringing together scientists and engineers from around the world to discuss the state of the art in x-ray applications as well as indications for future develop- ments. In recent years there has been a steady expansion of applications of x-ray analysis to characterize surfaces and thin films. To introduce the audience to one of the exciting and important new developments in x-ray fluorescence, the topic for the Plenary Session of the 1990 Conference was: "Surface and Near-Surface X-Ray Spectroscopy. " The Conference had the privilege of inviting five leading world experts in the field of x-ray spectroscopy to deliver lectures at the Plenary Session. The first two lectures were on total-reflection x-ray fluorescence spectrometry. Professor P. Wobrauschek of Austria reviewed "Recent Developments and Results in Total-Reflection X-Ray Fluorescence. " Trends and applications of the technique were also discussed. Dr. T. Arai of Japan reported on "Surface and Near-Surface Analysis of Silicon Wafers by Total Reflection X-Ray Fluorescence. " He emphasized the importance of using proper x-ray optics to achieve high signal-to-noise ratios. A mathematical model relating the x-ray intensity to the depth of x-ray penetration was also described.
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Add this copy of Advances in X-Ray Analysis, Vol. 21 to cart. $4.97, Sold by Zubal Books rated 4.0 out of 5 stars, ships from Cleveland, OH, UNITED STATES, published 1978 by Plenum.
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*Price HAS BEEN REDUCED by 10% until Monday, Nov. 25 (weekend sale item)* Volume 21, 325 pp., Hardcover, ex library, else text clean and binding tight. -If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
Add this copy of Advances in X-Ray Analysis, Vol. 25 to cart. $40.35, good condition, Sold by Fables Books rated 4.0 out of 5 stars, ships from Goshen, IN, UNITED STATES, published by Plenum Publishing Corporation.
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Good. A former library book with all the expected stamps stickers and markings. Excellent condition for a former library book. Some shelf storage or usage wear present. The binding is tight and all pages are present. Missing dustjacket. The pages appear unmarked. Pictures available upon request. Individually inspected by Shadow. Thanks for supporting an independent bookseller!
Add this copy of Advances in X-Ray Analysis, Vol. 21 to cart. $43.35, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Hialeah, FL, UNITED STATES, published 1978 by Plenum.
Add this copy of Advances in X-Ray Analysis Volume 34 Proceedings of the to cart. $45.00, like new condition, Sold by Harry Alter Books rated 3.0 out of 5 stars, ships from Sylva, NC, UNITED STATES.
Add this copy of Advances in X-Ray Analysis, Vol. 15 to cart. $52.53, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Hialeah, FL, UNITED STATES, published 1972 by Plenum.
Add this copy of Advances in X-Ray Analysis, Vol. 31 to cart. $55.30, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Hialeah, FL, UNITED STATES, published 1988 by Springer.
