The 41st Annual Conference on Applications of X-Ray Analysis was held August 2-6, 1993, at the Sheraton Denver Technical Center Hotel, Denver, Colorado. From its modest beginnings in the early 1950's, the Denver X-Ray Conference has grown to become a major venue in the national scientific calendar, with an ever-growing overseas participation. The 1993 Conference was the latest of these annual gatherings of x-ray analysts, who come together to discuss topics of current interest in diffraction and fluorescence. As the size ...
Read More
The 41st Annual Conference on Applications of X-Ray Analysis was held August 2-6, 1993, at the Sheraton Denver Technical Center Hotel, Denver, Colorado. From its modest beginnings in the early 1950's, the Denver X-Ray Conference has grown to become a major venue in the national scientific calendar, with an ever-growing overseas participation. The 1993 Conference was the latest of these annual gatherings of x-ray analysts, who come together to discuss topics of current interest in diffraction and fluorescence. As the size and flavor of the Conference has changed over the years, so too have the methods and techniques of x-ray materials analysis matured. Science is advanced by the creativity of a few and the mistakes of many. It is important, therefore, that from time to time we sit back and reflect on how we got where we are, and where we are likely to go next. There has been no greater impact on the field than the introduction of the digital computer, and the Plenary Session of the 1993 Conference, "Impact of the PC in X-Ray Analysis," was designed to reflect on the role of the personal computer in the metamorphosis of x-ray instrumentation and techniques. Since the personal computer is a creation of non-x-ray specialists, we, as a group, have simply attached ourselves to the coat-tails of experts and developers in the PC field and taken advantage of new computer systems as and when they were developed.
Read Less
Add this copy of Advances in X-Ray Analysis: Volume 37 to cart. $51.65, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2012 by Springer.
Add this copy of Advances in X-Ray Analysis: Volume 37 to cart. $54.36, good condition, Sold by Big River Books rated 5.0 out of 5 stars, ships from Powder Springs, GA, UNITED STATES, published 2012 by Springer.
Add this copy of Advances in X-Ray Analysis: Volume 37 to cart. $60.45, new condition, Sold by GreatBookPrices rated 4.0 out of 5 stars, ships from Columbia, MD, UNITED STATES, published 2012 by Springer.
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
New. Trade paperback (US). Glued binding. 756 p. In Stock. 100% Money Back Guarantee. Brand New, Perfect Condition, allow 4-14 business days for standard shipping. To Alaska, Hawaii, U.S. protectorate, P.O. box, and APO/FPO addresses allow 4-28 business days for Standard shipping. No expedited shipping. All orders placed with expedited shipping will be cancelled. Over 3, 000, 000 happy customers.
Add this copy of Advances in X-Ray Analysis: Volume 37 to cart. $88.09, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Newport Coast, CA, UNITED STATES, published 2012 by Springer.
