Traditionally the emphasis at each annual Denver X-ray Con- ference is placed on a particular aspect of X-ray analysis. The past decade has seen a steady expansion of applications of port- able X-ray analyzers and probes in the field, in boreholes and in plant process streams. With this in mind, the main theme of the current conference is field applications of X-ray fluorescence with particular reference to analysis of raw materials such as rocks, ores and coal. The Plenary Session took up this theme with two invited papers ...
Read More
Traditionally the emphasis at each annual Denver X-ray Con- ference is placed on a particular aspect of X-ray analysis. The past decade has seen a steady expansion of applications of port- able X-ray analyzers and probes in the field, in boreholes and in plant process streams. With this in mind, the main theme of the current conference is field applications of X-ray fluorescence with particular reference to analysis of raw materials such as rocks, ores and coal. The Plenary Session took up this theme with two invited papers reviewing applications of X-ray emission techniques to geochemical, borehole and on-stream analysis, and recent developments in port- able instruments for alloy, ore and other analyses. The third paper took us further afield with a review of X-ray spectrochemical analy- sis on Mars, the Moon and Earth. It is evident that portable X-ray analyzers are finding more and more applications outside the conventional boundaries of X-ray spectrometry. Users are not analysts and sometimes not even scien- tists. Until recently this trend has been hindered by the "scien- tific nature" of the instruments; one needs to understand XRF meth- ods in order to properly operate the instrument. Microprocessor technology has made possible the development of precalibrated, "smart" analyzers with readouts in quantities familiar to the user and interlocks to prevent erroneous operation. Further developments along these lines were reported at this conference.
Read Less
Add this copy of Advances in X-Ray Analysis: Volume 23 to cart. $38.17, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Newport Coast, CA, UNITED STATES, published 2011 by Springer.
Add this copy of Advances in X-Ray Analysis: Volume 23 to cart. $51.65, new condition, Sold by Ingram Customer Returns Center rated 5.0 out of 5 stars, ships from NV, USA, published 2011 by Springer.
Add this copy of Advances in X-Ray Analysis Volume 23 (Advances in X-Ray to cart. $10.00, very good condition, Sold by Zubal Books rated 5.0 out of 5 stars, ships from Cleveland, OH, UNITED STATES, published 1980 by Plenum Press.
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
390 pp., Hardcover, handstamps to front and rear free endpapers, else very good. -If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
Add this copy of Advances in X-Ray Analysis: Volume 23 to cart. $40.00, good condition, Sold by Bonita rated 4.0 out of 5 stars, ships from Newport Coast, CA, UNITED STATES, published 1980 by Springer.
Add this copy of Advances in X-Ray Analysis Proceedings of the 28th to cart. $104.00, very good condition, Sold by BingoBooks2 rated 5.0 out of 5 stars, ships from Vancouver, WA, UNITED STATES, published 1980 by New York, New York, U.S.A. : Plenum Pub Corp.
Choose your shipping method in Checkout. Costs may vary based on destination.
Seller's Description:
Very Good in Very Good jacket. Hardback book and dust jacket in very good to near fine condition, name stamped [type size] in upper corner of first blank page.
