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Advances in Imaging and Electron Physics: Theory of Intense Beams of Charged Particles Volume 166

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Advances in Imaging and Electron Physics: Theory of Intense Beams of Charged Particles Volume 166 - Hawkes, Peter W (Editor)
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Advances in Imaging and Electron Physics merges two long-running serials-- Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy . This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

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    eBook icon PDF eBook Theory of Intense Beams of Charged Particles: Optics of Charged Particle Analyzers

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    • Title: Theory of Intense Beams of Charged Particles: Optics of Charged Particle Analyzers by Hawkes, Peter W.
    • Publisher: Elsevier S & T
    • Print ISBN: 9780123813107, 0123813107
    • eText ISBN: 9780123813114
    • Edition: 2011
    • Format: PDF eBook
    $238.00
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