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Advanced VLSI Design and Testability Issues - Tripathi, Suman Lata (Editor), and Saxena, Sobhit (Editor), and Mohapatra, Sushanta Kumar (Editor)
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This book provides in-depth knowledge of VLSI and also the broad aspects of it by explaining its applications in different fields e.g. image processing and biomedical. The role of fault simulation algorithms is very well explained and its implementation using Verilog is the key aspect of this book.

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Advanced VLSI Design and Testability Issues 2022, CRC Press, Oxford

ISBN-13: 9780367538361

Trade paperback

Advanced VLSI Design and Testability Issues 2020, CRC Press, Oxford

ISBN-13: 9780367492823

Hardcover