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1. Pattern Recognition. Proceedings of the Ieee Workshop Held at Dorado, Puerto Rico
by Ed. Laveen N. Kanal
Seller Description: Very Good. First edition. Very good in very good dust jacket. Former owner name on top edge. Early symposium on the topic as applied to AI with papers in 3 catagories: character recognition, pattern perceptin and analsis and statistical classification procedures. Finale: "Impotence Principles for Machine Intelligence" by Louis Fein. See More Details
1968, Washington DC: Thompson Book Company, 1968 1st prtg. 447p
Hardcover, Very Good
Minneapolis, MN, USA
$25.00