This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. . Most up-to-date coverage of design for testability. . Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. . Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. . Lecture slides and ...
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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. . Most up-to-date coverage of design for testability. . Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. . Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. . Lecture slides and exercise solutions for all chapters are now available. . Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website."
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Add this copy of Vlsi Test Principles and Architectures: Design for to cart. $53.85, fair condition, Sold by HPB-Red rated 5.0 out of 5 stars, ships from Dallas, TX, UNITED STATES, published 2006 by Morgan Kaufmann.
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Add this copy of Vlsi Test Principles and Architectures: Design for to cart. $124.13, good condition, Sold by TEXTSHUB rated 5.0 out of 5 stars, ships from Franklin Lakes, NJ, UNITED STATES, published 2006 by Morgan Kaufmann.
