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Physical Principles of Electron Microscopy: An Introduction to Tem, Sem, and Aem

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Physical Principles of Electron Microscopy: An Introduction to Tem, Sem, and Aem - Egerton, R F
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Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of ...

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Physical Principles of Electron Microscopy: An Introduction to Tem, Sem, and Aem 2018, Springer, Cham

ISBN-13: 9783319819860

2nd Softcover Reprint of the Original 2nd 2016 edition

Trade paperback

Physical Principles of Electron Microscopy: An Introduction to Tem, Sem, and Aem 2016, Springer, Cham

ISBN-13: 9783319398761

2nd 2016 edition

Hardcover

Physical Principles of Electron Microscopy: An Introduction to Tem, Sem, and Aem 2005, Springer, New York, NY

ISBN-13: 9780387258003

2005 edition

Hardcover