Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications andthe only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
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Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications andthe only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.
Read Less
Add this copy of Introduction to Focused Ion Beams: Instrumentation, to cart. $69.33, fair condition, Sold by BooksRun rated 4.0 out of 5 stars, ships from Philadelphia, PA, UNITED STATES, published by Springer.
Add this copy of Introduction to Focused Ion Beams Instrumentation, to cart. $93.47, new condition, Sold by Paperbackshop rated 4.0 out of 5 stars, ships from Bensenville, IL, UNITED STATES, published 2010 by Springer Us.
Add this copy of Introduction to Focused Ion Beams Instrumentation, to cart. $95.50, fair condition, Sold by True Oak Books rated 5.0 out of 5 stars, ships from Highland, NY, UNITED STATES, published 2010 by Springer.
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Seller's Description:
Fair. 6.1 X 0.85 X 9.25 inches; 374 pages; Rippling to pages due to heavy water damage. Highlighting throughout the book. Fold crease on front cover. Reading copy.; -We're committed to your satisfaction. We offer free returns and respond promptly to all inquiries. Your item will be carefully wrapped in bubble wrap and securely boxed. All orders ship on the same or next business day. Buy with confidence.
Add this copy of Introduction to Focused Ion Beams: Instrumentation, to cart. $95.99, fair condition, Sold by Goodwill of Colorado rated 5.0 out of 5 stars, ships from COLORADO SPRINGS, CO, UNITED STATES.
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Seller's Description:
Fair. This item is in overall acceptable condition. Covers and dust jackets are intact but may have heavy wear including creases, bends, edge wear, curled corners or minor tears as well as stickers or sticker-residue. Pages are intact but may have minor curls, bends or moderate to considerable highlighting/ writing. Binding is intact; however, spine may have heavy wear. A well-read copy overall. Please note that all items are donated goods and are in used condition. Orders shipped Monday through Friday! Your purchase helps put people to work and learn life skills to reach their full potential. Orders shipped Monday through Friday. Your purchase helps put people to work and learn life skills to reach their full potential. Thank you!
Add this copy of Introduction to Focused Ion Beams: Instrumentation, to cart. $166.52, new condition, Sold by GridFreed rated 5.0 out of 5 stars, ships from North Las Vegas, NV, UNITED STATES, published 2004 by Springer.
